The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Dec. 03, 2004
Hiroaki Murakami, Austin, TX (US);
Hiromi Noro, Round Rock, TX (US);
Osamu Takahashi, Round Rock, TX (US);
Hiroaki Murakami, Austin, TX (US);
Hiromi Noro, Round Rock, TX (US);
Osamu Takahashi, Round Rock, TX (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems and methods for preventing the corruption of a CAM lookup result when a lookup in the CAM and a write to the CAM are concurrently executed. In one embodiment, a tag value is clocked into a tag latch simultaneously with a data value being clocked into a data latch. The tag value and initial CAM element values begin propagating through comparison logic. After a delay, the data value is written from the data latch to a CAM element. After the tag value and initial CAM values propagate through the comparison logic to produce comparison outputs, but before the newly written data value propagates through the comparison logic and changes the comparison outputs, the comparison outputs are latched. The comparison outputs can then be processed as if the data values in the CAM elements had not been changed by the write operation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile