The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Nov. 29, 2000
Gaurav Sharma, Webster, NY (US);
Thyagarajan Balasubramanian, Webster, NY (US);
Gaurav Sharma, Webster, NY (US);
Thyagarajan Balasubramanian, Webster, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A method and system validates an output used in calibrating a document processing system (DPS). The calibration target is generated for assessing the range of outputs of the DPS. The target comprises a plurality of target elements and element orientation information representing a physical layout of the target elements in a DPS output. The DPS output is generated in accordance with the calibration target. The characteristic values of the DPS output are measured corresponding to the individual target elements. If a mis-ordering of the measurements of the target elements is identified, the measurements of the target element of the DPS are reordered in accordance with the desired order for computing an appropriate calibration function without requirement of re-measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile