The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Nov. 07, 2002
Hideyuki Ikeda, Kyoto, JP;
Yuki Nakano, Kyoto, JP;
Hideyuki Ikeda, Kyoto, JP;
Yuki Nakano, Kyoto, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A particle diameter distribution measurement apparatus and method includes a sample cell that can be irradiated by a source of light. A plurality of detectors are positioned operatively adjacent to the sample cell to measure light interacting with a specimen in the sample cell. A storage unit stores values representative of outputs of the detectors for a plurality of standard particle sizes. The representation outputs extend across a range of detection for a plurality of detectors. A controller unit can perform a calibration based on the stored values and an actual measurement of one or more standard particle sizes that has the capability of providing a range of detection that will be inclusive of a standard particle size that is not available for measurement.