The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Aug. 06, 2004
Youzou Fukagawa, Tochigi, JP;
Youzou Fukagawa, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An exposure apparatus for exposing a substrate to light via a pattern of an original while the original and the substrate are scanned. The apparatus includes a stage configured to hold the substrate and to move, a projection optical system configured to project the pattern of the original onto the substrate, a measurement unit configured to measure a positional deviation between superposition marks formed on the substrate, and a controller configured to control operation of projection of a slit shot pattern of an original onto plural areas of a substrate, with each area partially overlapping four of the plural areas adjacent to each other. The projection is performed by keeping the original stand still and moving the stage, to cause the measurement unit to perform measurement of a positional deviation between superposition marks in each of the overlapping areas formed through the projection, and to control movement of the stage based on the measurement.