The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Apr. 10, 2000
Atsushi Watanabe, Tokyo, JP;
Taro Arimatsu, Yamanashi, JP;
Atsushi Watanabe, Tokyo, JP;
Taro Arimatsu, Yamanashi, JP;
Fanuc Ltd., Yamanashi, JP;
Abstract
An image processing apparatus capable of detecting position and posture of individual workpieces randomly arranged in a stack and having identical shapes. Reference models are created from two-dimensional images of a reference workpeace captured in a plurality of directions by a camera and stored. Also, the relative positions/postures of the workpiece with respect to the camera at the respective image capturing are stored. An image of a stack of workpieces is captured by the camera to obtain a two-dimensional image and the position/posture of the camera at the image capturing is stored. An image of a workpiece matched with one reference model is selected by matching processing of the reference model with the captured image. A three-dimensional position/posture of the workpiece with respect to the camera is obtained from the image of the selected workpiece, the selected reference model and position/posture information associated with the reference model. A picking operation for picking out a respective workpiece from a randomly arranged stack can be performed by a robot based on the position/posture of the workpiece.