The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2006

Filed:

Sep. 29, 2004
Applicants:

David J. Fitzgerald, Inver Grove Heights, MN (US);

David W. Kelly, Lino Lakes, MN (US);

Inventors:

David J. Fitzgerald, Inver Grove Heights, MN (US);

David W. Kelly, Lino Lakes, MN (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of testing a semiconductor circuit including a pair of contact pads, a biasing circuit for applying a voltage to the pair of contact pads, and a sensing circuit for providing a signal indicative of the voltage applied across the contact pads. The method includes determining a voltage gain and voltage offset of the sensing circuit while the biasing circuit is disabled. The method also includes enabling the biasing circuit to produce a voltage across the contact pads and determining, from the resulting output voltage produced by the sensing circuit, an actual output voltage produced by the biasing circuit at the contact pads based on the determined voltage gain and voltage offset of the sensing circuit.


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