The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7084623 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 01, 2006

Filed:

Sep. 24, 2002
Applicants:

Kazunobu Imamoto, Osaka, JP;

Takashi Kimura, Aichi, JP;

Inventors:

Kazunobu Imamoto, Osaka, JP;

Takashi Kimura, Aichi, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-destructive inspection device (X) includes an exciting pole () having a magnetic flux exciting surface () for exciting a magnetic flux to form a magnetic field in an inspection target, a recovering pole () having a magnetic flux recovering surface () for recovering the magnetic flux excited from the magnetic flux exciting surface (), and a coil array () having a plurality of loop coils though which the magnetic flux excited from the magnetic flux exciting surface () passes prior to reaching the inspection target, the coil array being offset toward the recovering pole () with respect to the magnetic flux exciting surface ().


Find Patent Forward Citations

Imamoto, Kazunobu. (2006). Non-destructive inspection device and method utilizing a magnetic field and sensor coil array (U.S. Patent No. 7084623). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7084623

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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