The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2006

Filed:

Jul. 11, 2002
Applicants:

Shlomo Lewkowicz, Kiryat Tivon, IL;

Daniel Gat, Haifa, IL;

Yehudit Kraizer, Kiryat Tivon, IL;

Zvika Gilad, Haifa, IL;

David Leuw, Haifa, IL;

Gavriel Meron, Petach Tikva, IL;

Arkady Glukhovsky, Nesher, IL;

Inventors:

Shlomo Lewkowicz, Kiryat Tivon, IL;

Daniel Gat, Haifa, IL;

Yehudit Kraizer, Kiryat Tivon, IL;

Zvika Gilad, Haifa, IL;

David Leuw, Haifa, IL;

Gavriel Meron, Petach Tikva, IL;

Arkady Glukhovsky, Nesher, IL;

Assignee:

Given Imaging Ltd., Yoqneam, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 5/117 (2006.01);
U.S. Cl.
CPC ...
Abstract

An in vivo examining device and method are described. The in vivo examining device has two operational phases; an initial phase in which the device is of initial dimensions and a final phase in which the device is of final dimensions. In the initial phase the device can pass freely through a normally configured body lumen whereas it may not be able to pass freely through an abnormally configured lumen. In the final phase the device can pass freely through a body lumen even if it is abnormally configured.


Find Patent Forward Citations

Loading…