The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2006
Filed:
Nov. 20, 2002
Weiqing Guo, Fremont, CA (US);
Sandeep Bhutani, Sunnyvale, CA (US);
Weiqing Guo, Fremont, CA (US);
Sandeep Bhutani, Sunnyvale, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An improved method for interconnect delay analysis for VLSI circuits reduces a parasitic graph for moment computation by eliminating one or more nodes in the graph. The elimination process is performed based upon the degree of the nodes. By eliminating nodes in this fashion, the computation complexity is significantly reduced. With this elimination process, resistor loops and crossed loops can also be solved. The order in which the nodes are eliminated is optimized using the depth-first-search method on the parasitic graphs, further reducing the computation complexity. The method provides a consistent functional interface, applicable to different circuit model structures. In addition, the method accounts for coupling capacitance between interconnects.