The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2006
Filed:
Nov. 25, 2002
Ajit D. Gupte, Pune, IN;
Shankaranarayana Karantha Deshamangala, Krishnapura, IN;
Amit Brahme, Pune, IN;
Jais Abraham, Malapurram, IN;
Ajit D. Gupte, Pune, IN;
Shankaranarayana Karantha Deshamangala, Krishnapura, IN;
Amit Brahme, Pune, IN;
Jais Abraham, Malapurram, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A non-robust test pattern, which causes a transition on a path of interest as well as off-paths, may be selected as being suitable for performing delay analysis of the path of interest (e.g., critical path) if the transitions caused on the off-paths would not overlap with the transition caused on the path of interest. In other words, an aspect of the present invention enables at least some non-robust test patterns to be used for performing delay analysis. As non-robust test patterns (as well as robust test patterns) can be used to perform delay analysis, the number of possible test patterns for performing speed analysis can be increased.