The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2006
Filed:
Oct. 31, 2002
Alex Fishman, Sunnyvale, CA (US);
Konstantinos G. Haritos, Saratoga, CA (US);
Paul Sung, Saratoga, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Alex Fishman, Sunnyvale, CA (US);
Konstantinos G. Haritos, Saratoga, CA (US);
Paul Sung, Saratoga, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
The present invention relates generally to an improvement in the ability of test systems to test bit processing capacities of electronic devices, and in particular an improvement in their ability to test the operation of an electronic device's transmitter and receiver circuitry. Data generated by a BERT is transmitted in an electrical form to a DUT and a master device. The DUT transmits data received in an electrical form to the master device in an optical form and the master device transmits data received in an electrical form to the DUT in an optical form. The master device and the DUT then transmit data received in an optical form back to the BERT in an electrical form. The data received from the DUT and the master device, respectively, is separately tested for bit errors. Do so enables to calculation of bit error rates for two distinguishable data paths through the DUT.