The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2006
Filed:
Aug. 20, 2004
Otto Z. Zhou, Chapel Hill, NC (US);
Jianping LU, Chapel Hill, NC (US);
Yueh Lee, Durham, NC (US);
Weili Lin, Chapel Hill, NC (US);
Yuan Cheng, Chapel Hill, NC (US);
Jian Zhang, Carrboro, NC (US);
Otto Z. Zhou, Chapel Hill, NC (US);
Jianping Lu, Chapel Hill, NC (US);
Yueh Lee, Durham, NC (US);
Weili Lin, Chapel Hill, NC (US);
Yuan Cheng, Chapel Hill, NC (US);
Jian Zhang, Carrboro, NC (US);
The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);
Abstract
Computed tomography device comprising an x-ray source and an x-ray detecting unit. The x-ray source comprises a cathode with a plurality of individually programmable electron emitting units that each emit an electron upon an application of an electric field, an anode target that emits an x-ray upon impact by the emitted electron, and a collimator. Each electron emitting unit includes an electron field emitting material. The electron field emitting material includes a nanostructured material or a plurality of nanotubes or a plurality of nanowires. Computed tomography methods are also provided.