The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2006
Filed:
Nov. 21, 2003
Shinichi Murakawa, Hyogo-ken, JP;
Takashi Doi, Hyogo-ken, JP;
Yoshio Egashira, Hyogo-ken, JP;
Shigeo Ueda, Shiga-ken, JP;
Shinichi Murakawa, Hyogo-ken, JP;
Takashi Doi, Hyogo-ken, JP;
Yoshio Egashira, Hyogo-ken, JP;
Shigeo Ueda, Shiga-ken, JP;
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Abstract
In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has a MISFET having a source, a gate and a drain. Then, a first voltage is applied to the target electrode such that a gate voltage is induced at the gate by electrostatic induction. Also, a second voltage is applied to at least one of the source and the drain such that current flows between the source and the drain based on the gate voltage. Then, a value of the current is examined to determine an electrical connection state of the target electrode.