The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2006
Filed:
Jan. 20, 2004
Applicants:
Dominique Breider, Lonay, CH;
Marc-henri Duvoisin, Préverenges, CH;
Dominique Marchal, Vallorbe, CH;
Vincent Thominet, Morges, CH;
Inventors:
Dominique Breider, Lonay, CH;
Marc-Henri Duvoisin, Préverenges, CH;
Dominique Marchal, Vallorbe, CH;
Vincent Thominet, Morges, CH;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and a device for measuring at least one test surface and a reference test surface having an interference measuring probe which emits a first measuring beam which is aligned with respect to the reference test surface, are described. The measuring probe emits at least one second measuring beam, which is aligned with respect to at least the at least one test surface.