The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2006

Filed:

May. 21, 2004
Applicants:

Jeffrey T. Duncan, Vail, AZ (US);

Benjamin Klaus, Tucson, AZ (US);

Robert J. Schaller, Tucson, AZ (US);

Inventors:

Jeffrey T. Duncan, Vail, AZ (US);

Benjamin Klaus, Tucson, AZ (US);

Robert J. Schaller, Tucson, AZ (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical sensor system () has an optical detector () with an active detector area () and a detector output signal (). A test-signal optical source () has a controllable optical source () having an output of a wavelength detectable by the optical detector (), and a test-signal director () that directs the output of the optical source () to the active detector area () of the optical detector (). A housing () encloses the optical detector () and the test-signal optical source (). A test instrumentation controller () controls the operation of the optical source (), and receives the detector output signal () for evaluation.


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