The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2006

Filed:

Dec. 23, 2003
Applicant:

Jong Goo Jung, Suwon-si, KR;

Inventor:

Jong Goo Jung, Suwon-si, KR;

Assignee:

Hynix Semiconductor Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses method for manufacturing device isolation film wherein a high selectivity slurry containing MPOis used for polishing nitride film to prevent the generation of moat. In accordance with the method, a pad oxide film and a pad nitride film formed on a semiconductor substrate and the semiconductor substrate are etched to form a trench. A liner nitride film and an oxide film for device isolation film filling the trench are formed on the entire surface. The oxide film for device isolation film is first etched using a low selectivity slurry, and further etched using a high selectivity slurry to expose the liner nitride film. The liner nitride film is polished using a high selectivity slurry containing MPOand the pad nitride film is then removed.


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