The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2006

Filed:

Mar. 20, 2001
Applicants:

Katsuhiko Machida, Tokyo, JP;

Sadayori Hoshina, Tokyo, JP;

Takashi Ushida, Ibaraki, JP;

Junichiro Arai, Ibaraki, JP;

Hideo Katayama, Ibaraki, JP;

Chiaki Okumura, Ibaraki, JP;

Yoshihisa Amano, Ibaraki, JP;

Inventors:

Katsuhiko Machida, Tokyo, JP;

Sadayori Hoshina, Tokyo, JP;

Takashi Ushida, Ibaraki, JP;

Junichiro Arai, Ibaraki, JP;

Hideo Katayama, Ibaraki, JP;

Chiaki Okumura, Ibaraki, JP;

Yoshihisa Amano, Ibaraki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); C12Q 1/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus wherein measurement current values output from a first oxygen sensor and a second oxygen sensor are time sequentially measured. Each moving average value is calculated from each sequential measurement current value. Each time differential value is calculated from the pair of each calculated moving average values, by least squares approximation. Then, drug susceptibility is measured based upon each calculated time differential value, so that drug the susceptibility measurement is performed quickly or accurately.


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