The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2006

Filed:

Aug. 30, 2004
Applicants:

Kenichi Inoue, Kobe, JP;

Akashi Yamaguchi, Kobe, JP;

Takayuki Hirano, Kobe, JP;

Tsutomu Mirimoto, Kobe, JP;

Hiroshi Gotoh, Kobe, JP;

Inventors:

Kenichi Inoue, Kobe, JP;

Akashi Yamaguchi, Kobe, JP;

Takayuki Hirano, Kobe, JP;

Tsutomu Mirimoto, Kobe, JP;

Hiroshi Gotoh, Kobe, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an electric-connection testing device of the present invention, a base and a rigid body, to which a substrate provided with a plurality of contacts are secured, are integrated and sandwich a leaf spring. The leaf spring has a spring structure with two or more independent elastic degrees of freedom. Such a small, simple, and adjustment-free structure can uniformize a pressing force applied from the contacts to electrodes of an object to be tested.


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