The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Dec. 02, 2002
Jun Akiyama, Kashihara, JP;
Tetsuya Okumura, Neyagawa, JP;
Jun Akiyama, Kashihara, JP;
Tetsuya Okumura, Neyagawa, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
There is provided a signal evaluation apparatus and signal evaluation method capable of consistently measuring an accurate bit error rate regardless of the distribution profile of the difference of likelihoods (difference metrics) of data sequences. In the signal evaluation apparatus for decoding data sequences by means of maximum likelihood decoding, at least one pair of paths between which a distance has a minimum value are selected by a path selector circuitWith regard to the paths selected by the path selector circuita difference metric obtained by a difference metric calculator circuitis statistically processed by a μ- and σ-calculator circuitto calculate a bit error rate. Then, the bit error rate is corrected by correction means () on the basis of the number of measurement samples of the paths selected by the path selector circuitand the number of all samples.