The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Feb. 03, 2003
Teresa Louise Mclaurin, Dripping Springs, TX (US);
Teresa Louise McLaurin, Dripping Springs, TX (US);
ARM Limited, Cambridge, GB;
Abstract
Within an integrated circuita functional block of circuitryhas an associated test wrapper circuit. The functional block of circuitryincludes functional latchesat least some of which may also serve as shared test latcheswithin the test wrapper circuitry. Separate reset signals reset_wrp, reset_int are generated for the test latches and shared test latchesas distinct from the functional latches. Thus, during testing, power consuming activity of the functional latchescan be suppressed if it is not desired to test the functional block of circuitryitself. This is a particularly useful technique when a functional block of circuitryis required to operate in an extest mode in which output signals from it are required to be driven so that other elements in the overall design may be tested and yet the internal action of the functional block of circuityis not under test.