The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2006

Filed:

Mar. 06, 2002
Applicants:

Mark L. James, Pasadena, CA (US);

Ryan M. E. Mackey, Pasadena, CA (US);

Han G. Park, Arcadia, CA (US);

Michail Zak, Cypress, CA (US);

Inventors:

Mark L. James, Pasadena, CA (US);

Ryan M. E. Mackey, Pasadena, CA (US);

Han G. Park, Arcadia, CA (US);

Michail Zak, Cypress, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A generalized formalism for diagnostics and prognostics in an instrumented system which can provide sensor data and discrete system variable takes into consideration all standard forms of data, both time-varying (sensor or extracted feature) quantities and discrete measurements, embedded physical and symbolic models, and communication with other autonomy-enabling components such as planners and schedulers. This approach can be adapted to on-board or off-board implementations with no change to the underlying principles.


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