The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
May. 30, 2001
Paul Joseph Stewart, Ann Arbor, MI (US);
Pietro Buttolo, Dearborn, MI (US);
Yifan Chen, Ann Arbor, MI (US);
Paul Joseph Stewart, Ann Arbor, MI (US);
Pietro Buttolo, Dearborn, MI (US);
Yifan Chen, Ann Arbor, MI (US);
Ford Global Technologies, LLC, Dearborn, MI (US);
Abstract
A system and method for design of experiments (DOE) using direct surface manipulation of a mesh model. The method includes the steps of selecting a geometric model in a computer-aided design (CAD) format, converting the geometric model into a mesh model and evaluating the mesh model using a computer-aided engineering (CAE) analysis. The method also includes the steps of determining whether to continue generating the design of experiments response, and modifying a surface of the mesh model by varying a predetermined parameter, wherein the surface is modified using direct surface manipulation (DSM), the mesh model is updated and the updated mesh model is used in continuing generating the design of experiments response, if determined to continue the design of experiments. The method further includes the steps of using the results of the CAE analysis for the design of experiments.