The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Apr. 14, 2003
Cary Gloor, Ft. Collins, CO (US);
Robert Benware, Ft. Collins, CO (US);
Robert Madge, Portland, OR (US);
Cary Gloor, Ft. Collins, CO (US);
Robert Benware, Ft. Collins, CO (US);
Robert Madge, Portland, OR (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A method for a modified binary search includes steps of: selecting a parameter having a distribution of values, selecting a probability density function representative of the distribution of values of the selected parameter, defining a substantially equal probability weighted binary test interval from the probability density function for each of a selected number of test intervals over a selected test range, translating the weighted binary test intervals to obtain a highest resolution at a target point of the selected parameter, and skewing the translated and weighted binary test intervals by a selected scaling function to generate a modified binary test interval for each of the selected number of test intervals over the selected test range.