The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Sep. 27, 2001
Richard Antony Kirk, Hertfordshire, GB;
Alexander Ralph Lyons, Bracknell, GB;
Adam Michael Baumberg, Bracknell, GB;
Richard Ian Taylor, Bracknell, GB;
Aaron William Christopher Kotcheff, London, GB;
Richard Antony Kirk, Hertfordshire, GB;
Alexander Ralph Lyons, Bracknell, GB;
Adam Michael Baumberg, Bracknell, GB;
Richard Ian Taylor, Bracknell, GB;
Aaron William Christopher Kotcheff, London, GB;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In an image processing system, a subject objectis placed on top of an object supporton a calibration objecthaving a known pattern of features thereon. Images recorded at different positions and orientations are processed to generate a three-dimensional computer model of the subject object alone or the subject object together with the calibration object. By imaging the subject objecton an object support instead of placing it directly on the calibration object, the user is provided with flexibility in the selection of the pattern and color of the calibration and the selection of the imaging positions and orientations. By providing an object supporthaving a top surface on which the subject objectsits which does not protrude from beneath the base of the subject object, the user is provided with flexibility in the selection of lighting conditions. By imaging the subject objectwith a background screenbehind it, the user is provided with flexibility in the selection of the surface on which the calibration objectis placed for imaging.