The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2006

Filed:

Nov. 17, 2004
Applicants:

Seigo Igaki, Kawasaki, JP;

Takahisa Ueno, Kawasaki, JP;

Tohru Horie, Higashine, JP;

Iwao Okamoto, Higashine, JP;

Inventors:

Seigo Igaki, Kawasaki, JP;

Takahisa Ueno, Kawasaki, JP;

Tohru Horie, Higashine, JP;

Iwao Okamoto, Higashine, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

After a measurement apparatus records a magnetization state of a reference pattern on at least one specific track of a recording medium, it generates a leakage magnetic field of a demagnetization pattern and demagnetizes the magnetization state of the reference pattern using the leakage magnetic field. Then, the measurement apparatus calculates a difference between the read output of a reference pattern before demagnetization and the read output of a reference pattern after demagnetization on the specific track and obtains a leakage magnetic field of a recording head from the obtained difference.


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