The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Jun. 14, 2002
Applicants:
Kevin B. Sartain, Broken Arrow, OK (US);
Kevin A. Dewitt, Appleton, WI (US);
Wael H. Elgamal, Tulsa, OK (US);
Richard M. Urquhart, Broken Arrow, OK (US);
Inventors:
Kevin B. Sartain, Broken Arrow, OK (US);
Kevin A. Dewitt, Appleton, WI (US);
Wael H. Elgamal, Tulsa, OK (US);
Richard M. Urquhart, Broken Arrow, OK (US);
Assignee:
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01G 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measurement system for measuring a parameter of a log is provided. A measuring device produces an emission in a direction of the log. A portion of the emission measures the parameter, such as log diameter, and communicates the diameter to the measuring device, which in turn communicates the diameter to a controller to selectively adjust converting equipment to vary the diameter.