The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Jul. 08, 2003
Mykhailo Shribak, Woods Hole, MA (US);
Rudolf Oldenbourg, Falmouth, MA (US);
Paul J. Cronin, Charlestown, MA (US);
Clifford C. Hoyt, Somerville, MA (US);
Peter J. Miller, Newburyport, MA (US);
Mykhailo Shribak, Woods Hole, MA (US);
Rudolf Oldenbourg, Falmouth, MA (US);
Paul J. Cronin, Charlestown, MA (US);
Clifford C. Hoyt, Somerville, MA (US);
Peter J. Miller, Newburyport, MA (US);
Marine Biological Laboratory, Woods Hole, MA (US);
Abstract
The invention provides a highly sensitive measurement of retardance and slow axis orientation, accurately and instantaneously, across a full two-dimensional image. There are no moving parts and there need not be any electro-optic tuning as part of the measurement. It is ideally adapted to real-time imaging and is well-suited to use with biological and medical samples, including visualizing structures in oocytes. The invention splits a light beam into several beams, which are analyzed using elliptical polarizers and the resultant intensity is measured. It can be constructed using a single pixilated detector, or several detectors, to achieve high spatial resolution when this is desired.