The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Oct. 07, 2003
Applicants:
Marc Bergendahl, Jericho, VT (US);
David Lewison, Larchmont, NY (US);
Raymond H. Puffer, Jr., Watervliet, NY (US);
Inventors:
Marc Bergendahl, Jericho, VT (US);
David Lewison, Larchmont, NY (US);
Raymond H. Puffer, Jr., Watervliet, NY (US);
Assignee:
Bausch & Lomb Incorporated, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for an inspection cell that allows contact lenses to be presented in a known orientation to an operator or vision system for inspection. The cell can be tipped to allow the inspected lens to be placed into a known pick-cup location upon passing inspection, or if the lens does not pass inspection, it can be discarded. The placement or discarding of the lens can be readily automated by selecting the rate at which the cell is tipped.