The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2006

Filed:

Mar. 18, 2002
Applicants:

Nicolas Vazquez, Austin, TX (US);

Kevin L. Schultz, Georgetown, TX (US);

Inventors:

Nicolas Vazquez, Austin, TX (US);

Kevin L. Schultz, Georgetown, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G09G 5/00 (2006.01); G06F 3/00 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for specifying a machine vision process utilizing two or more different program creation methodologies. In one embodiment, the different program creation methodologies may include specifying steps or operations for the process using graphical input panels, e.g., in a 'wizard-based' manner, and using graphical programming techniques for other portions, such as to specify decision operations. Thus, optimum program creation methodologies may be used for specifying different respective portions of the process.


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Vazquez, Nicolas. (2006). System and method for specifying a machine vision process using different programming methodologies (U.S. Patent No. 7079141). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7079141

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