The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Aug. 13, 2004
Valer Canda, Erlangen, DE;
Robert Krieg, Nuremberg, DE;
Oliver Schreck, Bamberg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A distortion-corrected magnetic resonance examination with a magnetic resonance device is undertaken by use of a distortion correction algorithm which uses coefficients to describe a magnetic field used in a measurement. In this case, after an examination area has been selected, by including the distortion correction algorithm and the coefficients for description of the magnetic field, a measurement area needed for correction is determined. Subsequently a magnetic resonance measurement is performed in the measurement area. Subsequently a distortion-corrected magnetic resonance image of the examination area is created with the aid of the distortion correction algorithm. In addition to the examination area, the measurement area and also any necessary measurement times can be shown on a display of the magnetic resonance device. This type of magnetic resonance examination does not include in the magnetic resonance image any picture elements which were not measured because of distortion.