The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Mar. 04, 2005
Dawn A. Bonnell, Media, PA (US);
Sergei V. Kalinin, Philadelphia, PA (US);
Rodolfo Antonio Alvarez, Philadelphia, PA (US);
Dawn A. Bonnell, Media, PA (US);
Sergei V. Kalinin, Philadelphia, PA (US);
Rodolfo Antonio Alvarez, Philadelphia, PA (US);
The Trustees Of The University of Pennsylvania, Philadelphia, PA (US);
Abstract
A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of: traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path; determining the sample surface topography along the path; substantially canceling the sample surface potential along the path using the determined sample surface topography; and determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.