The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2006

Filed:

Nov. 10, 2003
Applicants:

Hans Torp, Trondheim, NO;

Bjorn Olstad, Stathelle, NO;

Andreas Heimdal, Trondheim, NO;

Steinar Bjaerum, Trondheim, NO;

Inventors:

Hans Torp, Trondheim, NO;

Bjorn Olstad, Stathelle, NO;

Andreas Heimdal, Trondheim, NO;

Steinar Bjaerum, Trondheim, NO;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasound system and method for calculation and display of tissue deformation parameters are disclosed. A method to estimate a strain rate in any direction, not necessarily along the ultrasound beam, based on tissue velocity data from a small region of interest around a sample volume is disclosed. Quantitative tissue deformation parameters, such as tissue velocity, tissue velocity integrals, strain rate and/or strain, may be presented as functions of time and/or spatial position for applications such as stress echo. For example, strain rate or strain values for three different stress levels may be plotted together with respect to time over a cardiac cycle.


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