The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2006

Filed:

Nov. 19, 2003
Applicants:

Caibin Xiao, Harleysville, PA (US);

David A. Little, Newtown, PA (US);

Scott M. Boyette, New Hope, PA (US);

Inventors:

Caibin Xiao, Harleysville, PA (US);

David A. Little, Newtown, PA (US);

Scott M. Boyette, New Hope, PA (US);

Assignee:

General Electric Company, Fairfield, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01); G01K 17/08 (2006.01); G01K 1/16 (2006.01); G01N 25/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for the monitoring and measurement of chemical and/or biological deposition in heat exchangers and other fluid processing vessels. The new and original sensing system includes at least two hollow fluid vessels conductively mounted across a constant heat transfer path. Thin film heat flux sensors are attached to a heat transfer surface of the vessels in order to measure changes in differential heat flux that occur when deposition begins to accumulate in the vessel. In this way, it is shown that differential heat flux measurements can be used to detect and measure the early onset of chemical and/or biological deposition.


Find Patent Forward Citations

Loading…