The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Jul. 18, 2002
John Mcgee, Manchester, NH (US);
John Michael Earley, Amherst, NH (US);
James W. Matthews, Holden, MA (US);
John McGee, Manchester, NH (US);
John Michael Earley, Amherst, NH (US);
James W. Matthews, Holden, MA (US);
Opnet Technologies, Inc., Bethesda, MD (US);
Abstract
A system and method for dynamically generating alarm thresholds for performance metrics, and for applying those thresholds to generate alarms is described. Statistical methods are used to generate one or more thresholds for metrics that may not fit a Gaussian or normal distribution, or that may exhibit cyclic behavior or persistent shifts in the values of the metrics. The statistical methods used to generate the thresholds may include statistical process control (SPC) methods, normalization methods, and heuristics.