The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Oct. 16, 2002
Applicants:

Akira Fujibayashi, Sunnyvale, CA (US);

Kenji Yamagami, Los Gatos, CA (US);

Toshiyuki Abe, Kanagawa, JP;

Inventors:

Akira Fujibayashi, Sunnyvale, CA (US);

Kenji Yamagami, Los Gatos, CA (US);

Toshiyuki Abe, Kanagawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for failure detection comprises: checking, at a first time, a state of a local volume that is mirrored at a second location; issuing a change state command to the local volume; checking, at a second time, the state of the local volume after a host at the second location issues a change state command; comparing the state of the local volume at the first time and at the second time; and initiating a fail over procedure if the state of the local volume is different at the second time from the first time.


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