The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Nov. 20, 2003
James Patrick Allen, Austin, TX (US);
Timothy M. Damron, Austin, TX (US);
Stephen M. Tee, Marble Falls, TX (US);
Teerasit Tinnakul, Pflugerville, TX (US);
James Patrick Allen, Austin, TX (US);
Timothy M. Damron, Austin, TX (US);
Stephen M. Tee, Marble Falls, TX (US);
Teerasit Tinnakul, Pflugerville, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An error detection mechanism is provided for detecting sequential and distributed errors in a device I/O stream. The sensitivity of the errors is user definable. The result of the error detection is fed back into the path management software, which may use the error information to decide whether a device path should be disabled. The error detection mechanism sets a time span for a time window and counts the number of errors that occur during the time window. Each time a time window ends with at least one error, the sequential error count and the distributed error count are incremented. However, if an I/O returns without an error, the sequential error count is cleared. If the sequential error count reaches a predetermined limit, the path is disabled. After a predetermined number of time windows, if the distributed error count reaches a predetermined limit, the path is disabled.