The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Sep. 14, 2000
Applicant:

Taku Uchino, Los Angeles, CA (US);

Inventor:

Taku Uchino, Los Angeles, CA (US);

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06G 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is related to a method for estimating power consumption and noise levels of an integrated circuit which is composed of logic gates connected in the form of a plurality of stages. (1) At the outset, output signal waveforms and occurrence probabilities thereof at the first stage of the logic gates are calculated by the use of signal waveforms and occurrence probabilities thereof at primary input terminals of the integrated circuit; (2) next, output signal waveforms and occurrence probabilities thereof at the second stage of the logic gates are calculated by the use of the output signal waveform and the occurrence probability thereof at the primary input terminals and the output signal waveform and the occurrence probability thereof at the first stage of the logic gates; and (3) then, output signal waveforms and occurrence probabilities thereof at the n-th stage (n is a natural number) of the logic gates are calculated by the use of the output signal waveform and the occurrence probability thereof at the primary input terminals and the output signal waveform and the occurrence probability thereof at the (n-1)th stage of the logic gates. Thereby, types of the respective elementary waveforms, occurrence probabilities and signal correlations are calculated relating to signals located on each wiring of each stage inside of the integrated circuit and occurring within a predetermined time period.


Find Patent Forward Citations

Uchino, Taku. (2006). Method for estimating power consumption and noise levels of an integrated circuit, and computer-readable recording medium storing a program for estimating power consumption and noise levels of an integrated circuit (U.S. Patent No. 7076405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7076405

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