The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Oct. 10, 2003
Applicants:
Yiping Ding, Dover, MA (US);
Kenneth W. Newman, Cambridge, MA (US);
Inventors:
Yiping Ding, Dover, MA (US);
Kenneth W. Newman, Cambridge, MA (US);
Assignee:
BMC Software, Inc., Houston, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 15/00 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method using statistical parameters (e.g. mean, standard deviation, exceptional values) of performance monitoring metrics to substantially reduce the quantity of performance monitoring data collected and reported, make system performance monitoring scalable and enhance the readability of the system performance display. The number of metrics monitored may be reduced by monitoring only one of any two metrics that are closely correlated.