The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Oct. 31, 2002
Applicants:

Mostafa Pakzad, Palos Verdes Peninsula, CA (US);

Minh N. Trinh, Irvine, CA (US);

Ronald L. Nelson, Yorba Linda, CA (US);

Joseph M. Viglione, Laguna Hills, CA (US);

James M. Mang, Laguna Hills, CA (US);

Suleyman Attila Yolar, Irvine, CA (US);

Inventors:

Mostafa Pakzad, Palos Verdes Peninsula, CA (US);

Minh N. Trinh, Irvine, CA (US);

Ronald L. Nelson, Yorba Linda, CA (US);

Joseph M. Viglione, Laguna Hills, CA (US);

James M. Mang, Laguna Hills, CA (US);

Suleyman Attila Yolar, Irvine, CA (US);

Assignee:

Western Digital Technologies, Inc., Lake Forest, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An asynchronous system for testing disk drives includes a test platform that includes a plurality of slots for receiving and for providing communication with drives. The slots are segregated into a plurality of groups configured to satisfy predetermined environmental, communication bandwidth and test schedule requirements of the drives to be loaded therein. An automated loader/unloader is configured to selectively load drives into and out of the platform and to move drives between the plurality of groups. A module controller is assigned to each group of slots, each module controller being coupled to the slots of its assigned group and configured to administer at least one test to drives loaded in its assigned group while insuring that the predetermined environmental, communication bandwidth and test schedule requirements of its assigned group remain satisfied. A test matrix controller controls the loader/unloader to asynchronously move each drive that passes the test(s) administered in one group to a selected empty slot of another group for administration of a next test, to asynchronously move each drive that completes or fails the series of tests out of the platform. The moving steps are carried out without compromising the respective environmental, communication bandwidth and test schedule requirements of the plurality of groups.


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