The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Aug. 19, 2004
Hartmut Schäfer, Durmersheim, DE;
Peter Neidig, Ettlingen, DE;
Christian Fischer, Karlsbad, DE;
Manfred Spraul, Ettlingen, DE;
Hartmut Schäfer, Durmersheim, DE;
Peter Neidig, Ettlingen, DE;
Christian Fischer, Karlsbad, DE;
Manfred Spraul, Ettlingen, DE;
Bruker Biospin GmbH, Rheinstetten, DE;
Abstract
The invention refers to a method of resonance spectroscopy for the analysis of statistical properties of samples, comprising the following steps: a) recording of a complex resonance frequency spectrum of each sample by means of phase sensitive quadrature detection; b) numerical differentiation of the recorded complex resonance frequency spectra versus frequency; c) determination of the absolute value of each differentiated complex resonance frequency spectrum (=fingerprint); d) allocation of each fingerprint to a point of a multidimensional point set; and e) performing a pattern analysis of the generated points for characterizing the statistical properties of the samples. The inventive method tolerates unintended variances of measurement in the recorded resonance frequency spectra, in particular caused by phase errors, and allows reliable automated spectral analysis.