The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Jun. 17, 2002
Applicants:
Masakazu Mizoguchi, Tsukui-gun, JP;
Masahiko Kinukawa, Sagamihara, JP;
Takashi Fukaya, Sagamihara, JP;
Inventors:
Masakazu Mizoguchi, Tsukui-gun, JP;
Masahiko Kinukawa, Sagamihara, JP;
Takashi Fukaya, Sagamihara, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
First sensing means senses the three-dimensional position of a microscope, with an operating site as the origin. Second sensing means senses the three dimensional position of a surgical instrument with respect to the microscope. On the basis of the sensing results of the first sensing means and second sensing means, computing means calculates the three-dimensional position of the surgical instrument, with the operating site as the origin.