The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Mar. 16, 2004
Thomas Crevier, Sunnyvale, CA (US);
William B. Archibald, Foster City, CA (US);
Marc Hornbostel, Palo Alto, CA (US);
Dieter Schaefer, Goleta, CA (US);
Thomas Boussie, Menlo Park, CA (US);
Thomas Crevier, Sunnyvale, CA (US);
William B. Archibald, Foster City, CA (US);
Marc Hornbostel, Palo Alto, CA (US);
Dieter Schaefer, Goleta, CA (US);
Thomas Boussie, Menlo Park, CA (US);
Synyx Technologies, Inc., Santa Clara, CA (US);
Abstract
Computer programs and computer-implemented methods implement techniques for evaluating experimental data from a library of materials. The techniques receive a plurality of images of a library of materials that includes an array of members associated with locations in the library. User input identifying a plurality of regions of interest is received. A series of reduced data values is determined for one or more of the regions of interest as a statistical function of a plurality of pixel values for pixels in the corresponding regions. A figure of merit is calculated from one or more of the series of reduced data values for a library member at the corresponding library location. The regions of interest include a plurality of pixels in the images and correspond to locations in the library.