The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Mar. 26, 2003
Applicants:

Masaki Kato, Kanagawa, JP;

Shinya Narumi, Kanagawa, JP;

Katsuyuki Yamada, Kanagawa, JP;

Inventors:

Masaki Kato, Kanagawa, JP;

Shinya Narumi, Kanagawa, JP;

Katsuyuki Yamada, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a method and a device for recording optical data able to improve recording power setting during recording by means of PWM with a small number of pulses. During the test recording, using a period of a recording channel clock Tw as the minimum unit, marks having different mark lengths of n·Tw and n·Tw (n<n) are recorded with the same number of m (m<n) light emitting pulses, while successively changing the maximum power Pw of the recording signals. The recorded marks are reproduced and the mark lengths Tand Tare measured from the reproduced signals. The recording power can be set by evaluating the deviations D=T−n·Tw and D=T−n·Tw.


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