The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Sep. 02, 2004
Applicants:
Atsushi Yonetani, Tama, JP;
Kunihiko Uzawa, Sagamihara, JP;
Ken Kawamata, Tachikawa, JP;
Yorio Wada, Hanno, JP;
Nobuyoshi Toyohara, Sagamihara, JP;
Takeshi Deguchi, Matsutou, JP;
Inventors:
Atsushi Yonetani, Tama, JP;
Kunihiko Uzawa, Sagamihara, JP;
Ken Kawamata, Tachikawa, JP;
Yorio Wada, Hanno, JP;
Nobuyoshi Toyohara, Sagamihara, JP;
Takeshi Deguchi, Matsutou, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope includes an optical element provided with an anti-reflection film applied thereto. The anti-reflection film has the following layered structure:
Yonetani, Atsushi. (2006). Anti-reflection film and microscope having optical element with the same anti-reflection film applied thereto (U.S. Patent No. 7075714). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7075714
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile