The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Nov. 18, 2003
Applicants:
Nestor O. Farmiga, Rochester, NY (US);
Jack W. Frankovich, Fairport, NY (US);
Inventors:
Nestor O. Farmiga, Rochester, NY (US);
Jack W. Frankovich, Fairport, NY (US);
Assignee:
Corning Incorporated, Corning, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Compound surfaces of a test object are interferometrically measured by a multi-beam probe. One of two measuring beams emerges from the probe at a fixed angle for measuring one of the compound surfaces, and the other measuring beam emerges from the probe at a variable angle for measuring a plurality of other compound surfaces.
Farmiga, Nestor. (2006). Multi-beam probe with adjustable beam angle (U.S. Patent No. 7075660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7075660
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile