The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Oct. 31, 2005
Michael Asher, Conyers, GA (US);
Hossein Eslambolchi, Los Altos Hills, CA (US);
Chuck Giddens, Conyers, GA (US);
John Sinclair Huffman, Conyers, GA (US);
Harold Stewart, Alpharetta, GA (US);
Michael Asher, Conyers, GA (US);
Hossein Eslambolchi, Los Altos Hills, CA (US);
Chuck Giddens, Conyers, GA (US);
John Sinclair Huffman, Conyers, GA (US);
Harold Stewart, Alpharetta, GA (US);
Other;
Abstract
The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.