The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Jul. 08, 2004
Mannur J. Sundaresan, Greensboro, NC (US);
Anindya Ghoshal, Middletown, CT (US);
Mark J. Schulz, West Chester, OH (US);
Mannur J. Sundaresan, Greensboro, NC (US);
Anindya Ghoshal, Middletown, CT (US);
Mark J. Schulz, West Chester, OH (US);
North Carolina A&T State University, Greensboro, NC (US);
Abstract
A sensor array for non-destructively monitoring a structure to detect a critical structural event. The sensor array includes a plurality of discrete sensor nodes, each of the discrete sensor nodes producing an electrical signal in response to a structural event. A signal adder is electrically connected to the plurality of discrete sensor nodes for receiving and combining the electrical signal from each of the discrete sensor nodes to form a single sensor array output signal. A signal processing module then receives and processes the single sensor output signal. In the preferred embodiment, the signal processing module uses the time interval between the electrical signals from each of the discrete sensor nodes formed into a single sensor array output signal to calculate the location of the critical structural event. Also, in the preferred embodiment, a data collection system is located downstream of the sensor processing module.