The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Feb. 08, 2002
Hans-joachim Fabry, Berlin, DE;
Holger Heuermann, Holzkirchen, DE;
Hans-Joachim Fabry, Berlin, DE;
Holger Heuermann, Holzkirchen, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The invention relates to a method for correcting errors by de-embedding scattering parameters of a device under test associated with measuring ports (), the parameters being measured by a vector network analyzer including n measuring ports. The aim of the invention is to create a universal, precise and fast method of correcting errors of scattering parameters. To this end, the method includes the following steps: formula () two-port calibrations are carried out on different calibrating standards in any order in the active state between the measuring ports (), as a basis for a first error correction; the reflection parameters of at least one part of the n measuring ports () are determined in the inactive state, by way of the results of two-port measurements carried out on at least one calibrating standard switched in the active and/or inactive state on measuring ports (), as a basis for a second error correction. The invention also relates to a network analyzer and to a switching module for a network analyzer.