The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Mar. 07, 2005
Paul Samuel Smith, West Valley City, UT (US);
Paul Samuel Smith, West Valley City, UT (US);
Livewire Test Labs, Inc., Salt Lake City, UT (US);
Abstract
A system () and method to locate an anomaly () of a conductor () is provided. The system () uses a test set () to inject a test signal () into the conductor () at a location (P) and a probe () to detect the test signal () at a second location (P). A communication link () between the probe () and the test set () has a predetermined propagation delay (D), from which the system () can calculate a propagation delay (D) of the conductor () between the test set () and the probe (), and a propagation delay (D) between the probe () and the anomaly (). By varying the location (P) of the probe () until the propagation delay (D) between the probe () and the anomaly () is substantially zero, the precise location (P) of the anomaly () may be determined. The propagation velocity (V) of the conductor () may also be determined. The physical distance (L) between the probe () and the anomaly (), and hence the precise location (P) of the anomaly (), again may be determined.