The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Feb. 20, 2004
Applicant:

Masanori Tomioka, Okayama, JP;

Inventor:

Masanori Tomioka, Okayama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 3/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Tone wheel testing apparatus and the test method using the apparatus are disclosed. Tone wheel testing apparatus comprising a surface adjusting means for holding in the horizontal position an annular object to be tested to which a tone wheel is attached, the means comprising a pair of pressing members between which the object is held, and the one of the pressing members having a reference surface with which the tone wheel is contacted in order to make the tone wheel align in the rotary axis direction of the object, a rotatable chucking means for seizing the object so as to make the center of the object align with its rotary center when the object is held by the surface adjusting means, and a magnetic testing sensor disposed adjacent to the tone wheel of the object so as to face each other. According to which, the up and down appear on the tone wheel surface in the circumferential direction are corrected and the gap between the testing sensor and the tone wheel is accurately maintained, thereby enabling an appropriate setting arrangement of tone wheel for accurate measurement of the array pitch of each pole and the magnetic force.


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